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翻訳と辞書　辞書検索 [ 開発暫定版 ] スポンサード リンク High-definition metrology ： ウィキペディア英語版 High-definition metrology In metrology, high-definition metrology is where measurements are made densely across the observable extent of that surface or object and displayed with high-definition. In that sense, ''high-definition'' is analogous to ''high definition television''. High-definition measurements are therefore contrasted with "global" or "overall" or "statistical" measurements which provide some single or coarsely sampled measurement values that do not define the surface or object attribute variations in detail. Whereas the latter measurements may provide an indication of some overall characteristic of the item being measured, high-definition metrology is used where it is desired to also know more precisely at what location certain attributes occur, or where their values are outside of some specified range of values. In precision manufacturing, for example, this knowledge may enable remedial action to be taken to correct or control process variables that affect the dimensions of a manufactured part or assembly. ==References== 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「High-definition metrology」の詳細全文を読む スポンサード リンク 翻訳と辞書 : 翻訳のためのインターネットリソース Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.